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Perkin Elmer Sputtering System

Inventory on sale 

Bunch Sell List  [ 2 ]
Backside Equipment [ 2 ]
Deposition Equipment [ 0 ]
Dry Asher Etch RIE ICP [ 7 ]
Electronic Tester [ 1 ]
Iron Implanter [ 0 ]
Lithography & Photoresist [ 1 ]
Metrology & Inspection [ 6 ]
Rapid Thermal Process [ 3 ]
Sputtering and Evaporator System [ 1 ]
Wafer Probe [ 2 ]
Wet Processing Equipment [ 0 ]
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Metrology Equipment 
   Hitachi S-8840 CD-SEM
   
Hitachi S-8820 CD-SEM
   
Hitachi S-9300 CD-SEM
   
Hitachi S-5000H
   
Hitachi S-4700 FE-SEM
   
Hitachi S-4500 FE-SEM
   
Hitachi S-4160 FE-SEM
   
Hitachi S-2500ci SEM
   
Hitachi S-2300 SEM
   
Hitachi S-2150 SEM
   
Hitachi S-800 SEM
   
Hitachi S-570 SEM
   
LEO 982 FE-SEM
   
LEO 1550 FE-SEM
   
JEOL JSM 840
   
Micrion FIB M9500
   
Energy Dispersive X- Ray Spectrometer QUANTAX 200
   
XFlash 5010 Detector


High Quality Track Systems
   Tractrix Spin Tool
      Graphical User Interface
      
Features
      
Optional Features
      
Process Flows
   SpinBall Spin Station
   
Cartridge Dispense System
   
Manual Bake Oven
   
Enhanced SVG System


EQUIPE / PRI robot repair and refurbish
   ATM/EQUIPE robots
   
Robot Controllers
   
Wafer Prealigners
   
New Arrival


Main Quartz Ceramic SiC Si Parts
   Main Quartz Ceramic SiC Si Parts in stock on sale

 

Metrology & Inspection > KLA-Tencor Surfscan 6200

Please contact us by sales@globalnanotechequipment.com for more information.

Manufacturer:KLA-Tencor

Condition:Used,we sell it at AS IS(Refurbished and Installation are optional)

Price:Best Offer

Amount: 3 sets

Wafer Surface Analysis System/Particle Counter For Non-Patterned Wafers.
Wafer size from 2" to 8" dia.
Sensitivity - Particle: .117 micro-meter dia. latex spheres with > 90% capture rate.
Haze: .1 ppm minimum.
Cassette to cassette handling.
Supplies enlarged 3D images, scan prints for quick analysis.